John A Woollam

University of Nebraska-Lincoln, Electrical Engineering

Publications

• 1.

  2012

  T. Hofmann; P. Kühne; S. Schöche; Jr-Tai Chen; U. Forsberg; E. Janzén; N. Ben Sedrine; C.M. Herzinger; J.A. Woollam; M. Schubert; et al.

  Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures

  Applied Physics Letters 2012;101(19):.

• 2.

  2011

  T. Hofmann; D. Schmidt; A. Boosalis; P. Khne; R. Skomski; C.M. Herzinger; J.A. Woollam; M. Schubert; E. Schubert

  THz dielectric anisotropy of metal slanted columnar thin films

  Applied Physics Letters 2011;99(8):.

• 3.

  2011

  S. Schöche; Junxia Shi; A. Boosalis; P. Kühne; C.M. Herzinger; J.A. Woollam; W.J. Schaff; L.F. Eastman; M. Schubert; T. Hofmann

  Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures

  Applied Physics Letters 2011;98(9):.

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Institutional Network

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• External Coauthors
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