Analytical Instrumentation Facility

North Carolina State University, College of Engineering

Research Profile

• 

  secondary ion mass spectrometry

  
• 

  ion beams

  
• 

  Focused ion beams

  
• 

  silicon

  
• 

  Depth profiling

  
• 

  Ion implantation

  
• 

  Electron beams

  
• 

  Epitaxial growth

  
• 

  Transmission electron microscopy

  
• 

  Thin films

  

Publications

• 1.

  2013

  Katalin Böröczky; Ayako Wada-Katsumata; Dale Batchelor; Marianna Zhukovskaya; Coby Schal

  Insects groom their antennae to enhance olfactory acuity

  Proceedings of the National Academy of Sciences of the United States of America. 2013;110(9):3615-3620.

• 2.

  2013

  F.A. Stevie; P. Maheshwari; J.M. Pierce; B.T. Adekore; D.P. Griffis

  SIMS analysis of zinc oxide LED structures: Quantification and analysis issues

  Surface and Interface Analysis. 2013;45(1):352-355.

• 3.

  2012

  Chuanzhen Zhou; Min Li; Roberto Garcia; Anne Crawford; Keith Beck; David Hinks; Dieter P. Griffis

  Time-of-flight-secondary ion mass spectrometry method development for high-sensitivity analysis of acid dyes in nylon fibers

  Analytical Chemistry. 2012;84(22):10085-10090.

Grants

• 1.

  David Hinks; Keith Beck; Dieter Griffis

  Method Development and Validation of Comparative Finished Fiber Analysis Using Nano-Sampling Cryomicrotomy and Time-of-Flight Secondary Ion Mass Spectrometry

  1/1/2010 - 3/31/2013

  Sponsor: National Institute of Justice

  Funding: $ 619,141.00

• 2.

  Alan Batchelor; Dieter Griffis

  Nano Scale Characterization of Spun Polymeric Composite Fibers

  1/1/2008 - 1/15/2009

  Sponsor: 3F

  Funding: $ 49,968.00

• 3.

  Alan Batchelor; Dieter Griffis

  Nano Scale Characterization of Spun Polymeric Composite Fibers

  1/1/2008 - 1/15/2009

  Sponsor: 3F

  Funding: $ 11,262.00

Journals

•  
  Publications
• Microscopy and Microanalysis
  22
• Journal of the Electrochemical Society
  16
• Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
  16
• Applied Physics Letters
  14
• Applied Surface Science
  13

Institutional Network

• Internal
  Shared Pub.
• Physics & Astronomy
  33
• Materials Science & Engineering
  23
• Electrical & Computer Engineering
  18
• Physics
  14
• Silicon Solar Research Center
  3

• External
  Shared Pub.
• Alcatel-Lucent Bell Labs
  42
• University of Central Florida
  20
• Alcatel-Lucent
  13
• LSI Corporation
  11
• JEOL Ltd., Japan
  7
• Lehigh University
  7