Scopus Publication Detail
The publication detail shows the title, authors (with indicators showing other profiled authors), information on the publishing organization, abstract and a link to the article in Scopus. This abstract is what is used to create the fingerprint of the publication.
Quantifying the benefits of cycle time reduction in semiconductor wafer fabrication
Kazunori Nemoto; Elif Akcali; Reha Uzsoy (Profiled Author: Reha Uzsoy)
Proceedings of the IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium. 1996:130-136.
AbstractDue to policies set forth between SciVerse Scopus and this publisher, the abstract cannot be displayed here.
Scientific Context
This section shows information related to the publication - computed using the fingerprint of the publication - including related publications, related experts with fingerprints representing significant amounts of overlap between their fingerprint and this publication. The red dots indicate whether those experts or terms appear within the publication, thereby showing potential and actual connections.
Related Publications
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1.
2000Kazunori Nemoto; Elif Akcali; Reha M. Uzsoy
Quantifying the benefits of cycle time reduction in semiconductor wafer fabrication
IEEE Transactions on Electronics Packaging Manufacturing. 2000;23(1):39-47. -
2.
1997Elif Akcali; Randall D. Hamlin; Tim Teyner; Reha Uzsoy; Geetha Venkatachalam
Spare parts inventory management for semiconductor wafer fabrication facilities
IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings. 1997:A17-A20. -
3.
1993Craig N. Perry; Reha Uzsoy
Reactive scheduling of a semiconductor testing facility
IEEE/CHMT European International Electronic Manufacturing Technology Symposium. 1993:191-194.
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