Scopus Publication Detail
The publication detail shows the title, authors (with indicators showing other profiled authors), information on the publishing organization, abstract and a link to the article in Scopus. This abstract is what is used to create the fingerprint of the publication.
Explicit model for the gate tunneling current in double-gate MOSFETs
Ferney Chaves; David Jiménez; Jordi Suñé (Profiled Author: Jordi Suñé Tarruella)
Solid-State Electronics. 2012;68:93-97.
AbstractDue to policies set forth between SciVerse Scopus and this publisher, the abstract cannot be displayed here.
Scientific Context
This section shows information related to the publication - computed using the fingerprint of the publication - including related publications, related experts with fingerprints representing significant amounts of overlap between their fingerprint and this publication. The red dots indicate whether those experts or terms appear within the publication, thereby showing potential and actual connections.
Related Publications
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1.
2004W. Lai; J. Suñé; E. Wu; E. Nowak
Impact of stress induced leakage current on power-consumption in ultra-thin gate oxides
Annual Proceedings - Reliability Physics (Symposium). 2004:102-109. -
2.
2005E. Miranda; J. Molina; Y. Kim; H. Iwai
Effects of high-field electrical stress on the conduction properties of ultrathin La2 O3 films
Applied Physics Letters. 2005;86(23):1-3. -
3.
2005E. Miranda; J. Molina; Y. Kim; H. Iwai
Degradation of high-K LA2O3 gate dielectrics using progressive electrical stress
Microelectronics Reliability. 2005;45(9-11):1365-1369.
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