Scopus Publication Detail
The publication detail shows the title, authors (with indicators showing other profiled authors), information on the publishing organization, abstract and a link to the article in Scopus. This abstract is what is used to create the fingerprint of the publication.
Modeling the breakdown statistics of Al 2O 3/HfO 2 nanolaminates grown by atomic-layer-deposition
A. Conde; C. Martínez; D. Jiménez; E. Miranda; J.M. Rafí; F. Campabadal; J. Suñé (Profiled Authors: Jordi Suñé Tarruella; Enrique Alberto Miranda)
Solid-State Electronics. 2012;71:48-52.
AbstractDue to policies set forth between SciVerse Scopus and this publisher, the abstract cannot be displayed here.
Scientific Context
This section shows information related to the publication - computed using the fingerprint of the publication - including related publications, related experts with fingerprints representing significant amounts of overlap between their fingerprint and this publication. The red dots indicate whether those experts or terms appear within the publication, thereby showing potential and actual connections.
Related Publications
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1.
2012E. Miranda; C. Mahata; T. Das; J. Suñé; C.K. Maiti
Degradation and breakdown characteristics of Al/HfYO x/GaAs capacitors
Thin Solid Films. 2012;520(7):2956-2959. -
2.
2011V. Iglesias; M. Porti; M. Nafría; X. Aymerich; P. Dudek; G. Bersuker
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2011;29(1):01AB021-01AB024. -
3.
2011A. Conde; C. Martinez; X. Saura; D. Jiménez; E. Miranda; J.M. Rafi; F. Campabadal; J. Suñé
Modeling the breakdown statistics of Al 2O 3/HfO 2 nanolaminates grown by atomic-layer-deposition
2011 12th International Conference on Ultimate Integration on Silicon, ULIS 2011. 2011:160-163.
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