Scopus Publication Detail
The publication detail shows the title, authors (with indicators showing other profiled authors), information on the publishing organization, abstract and a link to the article in Scopus. This abstract is what is used to create the fingerprint of the publication.
Degradation and breakdown of thin silicon dioxide films under dynamic electrical stress
Montserrat Nafría; Jordi Suñé; David Yélamos; Xavier Aymerich (Profiled Authors: Xavier Aymerich Humet; Montserrat Nafría Maqueda; Jordi Suñé Tarruella)
IEEE Transactions on Electron Devices. 1996;43(12):2215-2226.
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Scientific Context
This section shows information related to the publication - computed using the fingerprint of the publication - including related publications, related experts with fingerprints representing significant amounts of overlap between their fingerprint and this publication. The red dots indicate whether those experts or terms appear within the publication, thereby showing potential and actual connections.
Related Publications
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1.
1995M. Nafría; D. Yélamos; J. Suñé; X. Aymerich
Relation between degradation and breakdown of thin SiO2 films under AC stress conditions
Microelectronic Engineering. 1995;28(1-4):321-324. -
2.
1997R. Rodriguez; M. Nafria; J. Suñe; X. Aymerich
Microelectronics Reliability. 1997;37(10-11):1517-1520. -
3.
1993Jordi Sune; Massimo Lanzoni; Piero Olivo
IEEE Transactions on Electron Devices. 1993;40(5):1017-1019.
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